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    • ISSN: 2010-0221 (Print)
    • Abbreviated Title: Int. J. Chem. Eng. Appl.
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National Taipei University of Technology, Taiwan
 

HOME > Archive > 2010 > Volume 1 Number 2 (Aug. 2010) >
IJCEA 2010 Vol.1(2): 151-154 ISSN: 2010-0221
DOI: 10.7763/IJCEA.2010.V1.26

Characterization of CdO Thin Films Prepared By SILAR Deposition Technique

M.Mahaboob Beevia , M.Anusuyab, V.Saravananc*   IACSIT Member

Abstract—Cadmium oxide thin films were deposited by Successive Ionic Layer Adsorption and Reaction (SILAR) method using as a source material of cadmium acetate and ammonium hydroxide solution on glass substrate. The effect of molarity is one of the important factors, which determines the quality of films. The present study determines the effect of molarity of solution on the structural, optical and morphological properties of as deposited films. XRD and SEM reveal that the crystallite size is increased with increase in molarity of precursor solution. UV-VIS spectrum of the films showed that the optical band gap energy increases with concentration of cadmium acetate in the precursor solution.

Index Terms—thin film; CdO; silar: xrd; SEM; optical

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Cite: M.Mahaboob Beevia , M.Anusuyab and V.Saravananc, "Characterization of CdO Thin Films Prepared By SILAR Deposition Technique," International Journal of Chemical Engineering and Applications vol. 1, no. 2, pp. 151-154, 2010.

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